HTRC-600型高溫導(dǎo)電材料電阻率測(cè)試系統(tǒng)是一款用于測(cè)量材料電阻，電導(dǎo)率的專用設(shè)備，采用由四端測(cè)量方法測(cè)試電阻率系統(tǒng)與高溫試驗(yàn)箱為一體的專用的高溫測(cè)試系統(tǒng)，滿足半導(dǎo)體及導(dǎo)體材料因溫度變化對(duì)電阻值變化的測(cè)量要求，通以在高溫、真空、氣氛的條件下測(cè)量導(dǎo)電材料電阻和電阻率，可以分析被測(cè)樣的電阻和電阻率隨溫度、時(shí)間變化的曲線．目前主要針對(duì)圓片、方塊、長(zhǎng)條等樣品進(jìn)行測(cè)試，可以廣泛用于碳系導(dǎo)電材

詳細(xì)介紹

HTRC-800型高溫導(dǎo)電材料電阻率測(cè)試系統(tǒng)

關(guān)鍵詞：電導(dǎo)率，電阻率，高溫600℃，兩探針，四探針

HTRC-800型高溫導(dǎo)電材料電阻率測(cè)試系統(tǒng)是一款用于測(cè)量材料電阻，電導(dǎo)率的專用設(shè)備，采用由四端測(cè)量方法測(cè)試電阻率系統(tǒng)與高溫試驗(yàn)箱為一體的專用的高溫測(cè)試系統(tǒng)，滿足半導(dǎo)體及導(dǎo)體材料因溫度變化對(duì)電阻值變化的測(cè)量要求，通以在高溫、真空、氣氛的條件下測(cè)量導(dǎo)電材料電阻和電阻率，可以分析被測(cè)樣的電阻和電阻率隨溫度、時(shí)間變化的曲線．目前主要針對(duì)圓片、方塊、長(zhǎng)條等樣品進(jìn)行測(cè)試，可以廣泛用于碳系導(dǎo)電材料、金屬系導(dǎo)電材料、金屬氧化物系導(dǎo)電材料、結(jié) 構(gòu)型高分子導(dǎo)電材料、復(fù)合導(dǎo)電材料等材料的電阻率測(cè)量。測(cè)控軟件可以顯示出溫度與電阻，電阻率，電導(dǎo)率數(shù)據(jù)的變化曲線。

一、主要應(yīng)用范圍：

1、廣泛用于碳系導(dǎo)電材料的電阻率和電導(dǎo)率測(cè)量

2、金屬系導(dǎo)電材料的電阻率和電導(dǎo)率測(cè)量

3、金屬氧化物系導(dǎo)電材料的電阻率和電導(dǎo)率測(cè)量

4、高分子導(dǎo)電材料的電阻率和電導(dǎo)率測(cè)量

5、復(fù)合導(dǎo)電材料等材料的電阻率測(cè)量

6、可以測(cè)量硅、鍺單晶（棒料、晶片）電阻率

7、符合標(biāo)準(zhǔn)：ASTM B193-02和GBT 6146-2010 、GBT15662-1995

8、產(chǎn)品主要特點(diǎn)：

1、高溫兩探針夾具與帶升降高溫測(cè)試平臺(tái)配合使用，組成高溫兩探針測(cè)試平臺(tái)；

2測(cè)溫?zé)犭娕继筋^與樣品平臺(tái)為同一熱沉，確保測(cè)量溫度與樣品溫度的一致性；

3、采用緊湊型設(shè)計(jì)，體積小、結(jié)構(gòu)簡(jiǎn)潔，操作簡(jiǎn)單、方便；

4' 隔熱盤隔離樣品平臺(tái)與調(diào)節(jié)平臺(tái)，并與高溫測(cè)試平臺(tái)重合，具有理想的隔熱保溫效果；

5、探針調(diào)節(jié)裝置具有三維精確調(diào)節(jié)功能，精確定位探針的位置；

6、探針調(diào)節(jié)裝置具有粗調(diào)功能，有效增大探針的調(diào)節(jié)范圍；

7、探針調(diào)節(jié)裝置帶探針壓力調(diào)節(jié)功能，確保探針與樣品的良好接觸，又不損傷樣品；

8、探針采用帶同軸屏蔽層設(shè)計(jì)，減少電磁對(duì)測(cè)量的干擾；

9、探針電極選用鉑銥合金，有效減少接觸電阻，并具有良好的高溫抗氧化能力；

10、自帶校準(zhǔn)件，與各測(cè)試儀器配套，校準(zhǔn)測(cè)試夾具。

主要技術(shù)參數(shù)：

1、測(cè)量溫度范圍：RT~600℃或RT~800℃或RT~1200℃可選

2、測(cè)試探針： 2個(gè)高溫高頻探針或4個(gè)高頻探針

3、電極直徑：26.8mm

4、樣品大小：厚度小于10 mm，直徑5~40mm

5、溫控方式：恒溫、變溫、常溫

6、控溫精度：±0.4℃

7、電阻率：10nΩ-10MΩ

8、電阻：10nΩ-100MΩ

9、電導(dǎo)率：10-5 ～105 s/cm

10、重量：38KG

11、工作溫度：5℃至40℃

12、重量：15KG

13、可以配合任意型號(hào)Agilent 、 WayneKer r 、 So lar tron 、同惠、 Keysight

等LCR表進(jìn)行無縫結(jié)合

14、設(shè)備可以配合ZJ-3型和ZJ-6型壓電測(cè)試儀進(jìn)行壓電D33系數(shù)測(cè)量

HTRC-600 resistivity testing system for high temperature conductive materials is a special equipment for measuring material resistance and conductivity. It adopts a special high temperature testing system consisting of a four-terminal resistivity measuring system and a high temperature test box to meet the measurement requirements of resistance changes of semiconductor and conductive materials due to temperature changes. It can be used in high temperature, vacuum and atmosphere. Measuring the resistance and resistivity of conductive material under a piece can analyze the curve of the resistance and resistivity changing with temperature and time. At present, the test is mainly aimed at disc, square, strip and other samples, which can be widely used in carbon conductive material, metal conductive material, metal oxide conductive material, structural polymer conductive material, composite conductive material and so on. Resistivity measurement of materials. Advanced measurement and control software can show the curves of temperature and resistance, resistivity and conductivity data.

I. Main applications:
1. Widely used for resistivity and conductivity measurement of carbon-based conductive materials
2. Measurement of resistivity and conductivity of metal conductive materials
3. Measurement of resistivity and conductivity of metal oxide conductive materials
4. Measurement of Resistivity and Conductivity of Polymer Conductive Materials
5. Resistivity Measurement of Composite Conductive Materials and Other Materials
6. Measurable resistivity of silicon and germanium single crystals (rods and wafers)
7. Compliance criteria: ASTM B193-02 and GBT 6146-2010, GBT 15662-1995
8. Main features of the product:
1. The high temperature two-probe fixture is used in conjunction with the high temperature test platform with lifting and lowering to form a high temperature two-probe test platform.
The thermocouple probe and the sample platform are the same heat sink to ensure the consistency between the measured temperature and the sample temperature.
3. Compact design, small size, simple structure, simple operation and convenience;
4. Isolating the sample platform and adjusting platform of the heat insulation disk, and coinciding with the high temperature test platform, it has ideal heat insulation effect.
5. The probe adjusting device has three-dimensional precise adjusting function, which can accurately locate the position of the probe.
6. The probe adjusting device has the function of coarse adjustment, which effectively enlarges the adjusting range of the probe.
7. The probe regulator has the function of adjusting the pressure of the probe to ensure the good contact between the probe and the sample without damaging the sample.
8. The probe is designed with coaxial shielding layer to reduce electromagnetic interference to measurement.
9. The platinum-iridium alloy is selected as probe electrode, which can effectively reduce the contact resistance and has good high temperature oxidation resistance.
10. Bring calibration parts with each test instrument to calibrate test fixture.
Main technical parameters:
1. Measuring Temperature Range: RT~600 C or RT~800 C or RT~1200 C is optional.
2. Test Probes: Two High Temperature and High Frequency Probes or Four High Frequency Probes
3. Electrode diameter: 26.8mm
4. Sample size: less than 10 mm in thickness and 5-40 mm in diameter
5. Temperature Control: Constant Temperature, Variable Temperature and Normal Temperature
6. Temperature Control Accuracy: +0.4 C
7. Resistivity: 10n-10MΩ
8. Resistance: 10n-100MΩ
9. Conductivity: 10-5-105 s/cm
10. Weight: 38KG
11. Working Temperature: 5 40 C
12. Weight: 15K
13. Can cooperate with any type of Agilent, Wayne Ker, So lar tron, Tonghui, Keysight
Seamless Combination of Equal LCR Table

14. The equipment can cooperate with ZJ-3 and ZJ-6 piezoelectric testers to measure piezoelectric D33 coefficients.